Applied logistic regression / David W. Hosmer y Stanley Lemeshow

Por: Hosmer, David W [autor]Colaborador(es): Hosmer, David W | Lemeshow, Stanley [autor] | Sturdivant, Rodney X [autor]Tipo de material: TextoTextoIdioma: Inglés Series Wiley series in probability and statisticsDetalles de publicación: Nueva York: Wiley & Sons Ltd 2013Descripción: xii, 373 p. : il. ; 25 cmISBN: 978-0-470-58247-3Tema(s): ANALISIS DE REGRESIÓN | ANALISIS ESTADISTCIO | ESTADISTICA APLICA | MODELOS LÓGICOSClasificación CDD: 519.536 Resumen: In this revised and updated edition, the authors continue to provide an accessible introduction to the logistic regression model while incorporating advances of the last decade, including a variety of software packages for the analysis of data sets. They extend the discussion from biostatistics and epidemiology to cutting-edge applications in data mining and machine learning, guiding readers step-by-step through the use of modeling techniques for dichotomous data in diverse fields. Ample new topics and expanded discussions of existing material are accompanied by real-world examples-with extensive data sets available over the Internet.
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In this revised and updated edition, the authors continue to provide an accessible introduction to the logistic regression model while incorporating advances of the last decade, including a variety of software packages for the analysis of data sets. They extend the discussion from biostatistics and epidemiology to cutting-edge applications in data mining and machine learning, guiding readers step-by-step through the use of modeling techniques for dichotomous data in diverse fields. Ample new topics and expanded discussions of existing material are accompanied by real-world examples-with extensive data sets available over the Internet.

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